Automated Defect Detection System, Optical Stylus System for BOW, WRAP Metrology, Non Contact Optical Surface Profiler, Vision Based CD Measurement System
HV/UHV DC/ RF Magnetron Sputtering Systems, E-Beam And Thermal Evaporation, Plasma , Rapid Thermal Annealing System
Spectroscopic Ellipsometer
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9971025428
Laser Pattern Generator
Hall Effect Measurement System, LED Tester, Probe Station Mannual, Semiautomatic and Fully Automatic
Instrumentation for Photovoltaic (Spectral Response/QE Measurement System, Small Area Solar Simulator, Solar Cell I-V Tester, I-V Curve Data Acquisition System, Solar Cell Sorter, Spectro Radiometer
UHV deposition & MBE System or Oxides and Nitrides
Four Point Probe Systems
Precision Dicing and Scribing and Grinding Machine
MOCVD
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9971025428
EdgeTech Scientific Pvt Ltd
NANOTECHNOLOGY
Process, Engineering and Characterization Equipments
Scanning Probe Microscope (AFM / STM / SNOM)
Nano Indentation System
E-Beam, Lithography System
Nano-Imprint
Lithography System Lithography Upgrades for SEMs, Beam Blankers, X-Y stages for SEM
Thermal CVD, LPCVD and PECVD System for CNT, Graphene and 2d Materials
Non Contact Optical Profiler
Atomic Layer Deposition System
Nanpositioning and Nano Measuring Systems
In-situ Nanocleaning, Nanoindentation, TEM Lamella preparation,IV Charaterteristic, Nanocutting, Nanocladding
EdgeTech Scientific Pvt Ltd
MATERIALS
Packaging Material
Tungsten-copper (WCu, CuW),Heat Sinks,
Molybdenum-copper (MoCu, SuMo) Heat Sinks,
Cu/Mo70Cu/Cu Heat Sinks, Ceramic RF,
Microwave and Power Packages
Molybdenum and Molybdenum Alloys
Tungsten Metal Products and Alloys
Graphene Material
CVD Graphene Films, Graphene Oxide CVD, Graphene on TEM Grid, Graphene Quantum Dot and Accessories.
Substrate Single Crystals For Superconductivity : Al2o3, LaAlo3, Mgo, SrTio3, Nb:Srtio3,YAIo3, Zro2(Y), etc. Bicrystals : Al2o3, Mgo, Srtio3, Nb: Srtio3, Zro2 For III-V Nitrides : Al2o3, Lialo2, Ligao2, MgAl, ZnO, etc. Epi-ready polishing of surface with an orientation (standard) and better.
Single Crystals BaTio3, Coo, Cr2o3, Feo, Fe2o3, Gd3Ga5O12, Mno, Nio, Sio2 , etc. Polishing of surface with an orientation accuracy form 20 to <0.10
Pure Elements and Alloys Ag, Al, As, Au, B, Be, Bi, C, Ca, Cd, Ce, Cc, Eu, Fe, Ga, Ge, hf, Ho, In, Ir, K , La, Li, Lu, Nd, Ni, Os, P, Pb, Pd, Pr, Pt, Rb, Re,Rh, Ru, S, Sn, Sr, Ta , Te, Tb, TL, Th, Tm, Ti, U, V, W , Y, Yb, Pure ingots, tubes, foils, wires, granules, thermo elements etc. Polishing of surface with an orientation accuracy form 20 to <0.10 Purity from 3N to 7N.
Optical Crystals AgBr, AgCl, BaF2, CaF2, CdTe, CsI, fused silica, Ge, Kbr, KCI, KRS-5, LiF, MgF2, Sapphire (including tubes), Si, znse Mirrors, Prisms, lenses, windows & wedges with diameter up to 8.5″
Semiconductor Single Crystals Electronic grade Ge-and si-wafers(doped and u II-VI Semiconductors (CdTe, Cds,CdSe, Zns, Zn III-V Semiconductors (GaAs, GaP, GaSB, InAs, Ir IV-Vi semiconductors (Pbs,PbSe,PbTe, SnTe.
Sputter Targets Metal, non-metals and chemical compounds With purity from 99 to 99.99999%
